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1. Scanning thermal failure microscopy of multilayer ceramic capacitors NSTL国家科技图书文献中心

Du, Wentong |  Yi, Cheng... -  《Journal of Alloys and Compounds》 - 2025,1022 - 179878~ - 共6页

摘要:A high resolution scanning thermal failure microscopy (STFM) was developed based on the commercial atomic force microscopy and used for local heating, local aging of the dielectric layers, and charact...
关键词: Local aging |  Local reliability |  Local thermal strain |  Multilayer ceramic capacitors (MLCCs) |  Scanning thermal failure microscopy (STFM)

2. Fractional-order PD control at Hopf bifurcation in a delayed predator-prey system with trans-species infectious diseases EI 工程索引 NSTL国家科技图书文献中心

Du, Wentong |  Xiao, Min... -  《Mathematics and computers in simulation》 - 2023,205 - 414~438 - 共25页 - 被引量:15

摘要:In this paper, a delayed fractional-order predator-prey system with trans-species infectious diseases is proposed and the corresponding control strategy is implemented via fractional-order proportiona...
关键词: Fractional-order PD controller |  Hopf bifurcation |  Infectious diseases |  Predator-prey system |  NEURAL-NETWORKS |  MODEL |  STABILITY |  DYNAMICS

3. Direct Observation of Local Dielectric Conductive Paths and Their Dynamics in the Degraded Multilayer Ceramic Capacitors NSTL国家科技图书文献中心

Du, Wentong |  Ying, Yuxin... -  《physica status solidi(RRL): rapid research letterse》 - 2023,17(7) - 共7页 - 被引量:1

摘要:Scanning thermal microscopy is used to perform direct imaging local conductive path and dynamic behaviors in the degraded multilayer ceramic capacitors (MLCCs) due to the thermal conductivity differen...
关键词: local conductive paths |  multilayer ceramic capacitors |  scanning thermal microscopy |  INSULATION RESISTANCE |  OXYGEN NONSTOICHIOMETRY |  BATIO3 |  PERSPECTIVES |  DEGRADATION |  CHALLENGES |  EVOLUTION...

4. Unusual local electric field concentration in multilayer ceramic capacitors

Du, Wentong |  Zeng, Huarong... -  《journal of materiomics》 - 2023,9(2) - 403~409 - 共7页 - 被引量:3

摘要:Local electric-field around multitype pores (dielectric pore, interface pore, electrode pore) in multilayer ceramic capacitors (MLCCs) was investigated using Kelvin probe force microscopy combined wit...
关键词: Multilayer ceramic capacitors (MLCCs) |  Kelvin probe force microscopy |  Pore |  Local electric field concentration |  PROBE FORCE MICROSCOPY |  DIELECTRIC-BREAKDOWN |  DEFECTS |  MICROSTRUCTURE |  POLARIZATION |  PERSPECTIVES...
检索条件作者:Du, Wentong
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